>>Jeg har taget diverse harddisks test men kan ikke finde én eneste fejl på
>>disken. Er det fordi de 8 fejl er meldt som døde og at de aldrig igen vil
>>blive brugt (og derfor ikke findes af testen) eller er det SMART der er
>>lige
>>smart nok og måske fejlrapportere?
>
> Mangler nogle oplysninger. Kør en
> smartctl - a /dev/hda
> og vis os den fulde udskrift.
> Også meget gerne en udskrift af din /etc/smartd.conf fil.
> SÅ skal vi prøve at hjælpe dig på vej...
Jo, men den er jo ret uoverskuelig her, hvor det hele bliver wrappet til
60-70 karaktére. Men her er det:
[root@]# smartctl -a /dev/hda
smartctl version 5.36 [i686-redhat-linux-gnu] Copyright (C) 2002-6 Bruce
Allen
Home page is
http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Fujitsu MHTxxxxAH family
Device Model: FUJITSU MHT2040AH
Serial Number: NP0JT4B2DGKJ
Firmware Version: 846C
User Capacity: 40,007,761,920 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 3a
Local Time is: Sat Jul 14 14:30:15 2007 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection:
Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has
ever
been run.
Total time to complete Offline
data collection: ( 293) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off
support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 40) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail
s - 136981
2 Throughput_Performance 0x0005 100 100 030 Pre-fail
ine - 11927734
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail
s - 0
4 Start_Stop_Count 0x0032 099 099 000 Old_age
ys - 2512
5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail
s - 8589934592000
7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail
s - 824
8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail
ine - 3
9 Power_On_Seconds 0x0032 090 090 000 Old_age
ys - 5113h+05m+53s
10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail
s - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age
ys - 1568
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age
ys - 152
193 Load_Cycle_Count 0x0032 095 095 000 Old_age
ys - 56909
194 Temperature_Celsius 0x0022 100 100 000 Old_age
ys - 41 (Lifetime Min/Max 10/51)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age
ys - 250
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age
ys - 287047680
197 Current_Pending_Sector 0x0012 100 100 000 Old_age
ys - 0
198 Offline_Uncorrectable 0x0010 100 100 000 Old_age
line - 1
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age
ys - 0
200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail
s - 8144
203 Run_Out_Cancel 0x0002 100 100 000 Old_age
ys - 429519470745
SMART Error Log Version: 1
ATA Error Count: 8 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 8 occurred at disk power-on lifetime: 4645 hours (193 days + 13 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 07 b0 78 5e e0 Error: UNC 7 sectors at LBA = 0x005e78b0 = 6191280
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 af 78 5e e0 00 00:02:59.386 READ DMA
c8 d8 08 af 78 5e e0 00 00:02:55.495 READ DMA
c8 d8 01 00 00 00 e0 00 00:02:55.495 READ DMA
c8 d8 08 b7 78 5e e0 00 00:02:55.495 READ DMA
c8 d8 01 00 00 00 e0 00 00:02:55.495 READ DMA
Error 7 occurred at disk power-on lifetime: 4645 hours (193 days + 13 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 07 b0 78 5e e0 Error: UNC 7 sectors at LBA = 0x005e78b0 = 6191280
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 af 78 5e e0 00 00:02:55.495 READ DMA
c8 d8 01 00 00 00 e0 00 00:02:55.495 READ DMA
c8 d8 08 b7 78 5e e0 00 00:02:55.495 READ DMA
c8 d8 01 00 00 00 e0 00 00:02:55.495 READ DMA
c8 d8 08 af 78 5e e0 00 00:02:51.593 READ DMA
Error 6 occurred at disk power-on lifetime: 4645 hours (193 days + 13 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 07 b0 78 5e e0 Error: UNC 7 sectors at LBA = 0x005e78b0 = 6191280
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 af 78 5e e0 00 00:02:51.593 READ DMA
c8 d8 08 af 78 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 3f 00 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 47 00 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 37 00 5e e0 00 00:02:47.611 READ DMA
Error 5 occurred at disk power-on lifetime: 4645 hours (193 days + 13 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 07 b0 78 5e e0 Error: UNC 7 sectors at LBA = 0x005e78b0 = 6191280
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 af 78 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 3f 00 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 47 00 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 37 00 5e e0 00 00:02:47.611 READ DMA
c8 d8 08 2f 00 5e e0 00 00:02:47.610 READ DMA
Error 4 occurred at disk power-on lifetime: 4645 hours (193 days + 13 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 59 07 b0 78 5e e0 Error: UNC 7 sectors at LBA = 0x005e78b0 = 6191280
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 d8 08 af 78 5e e0 00 00:02:43.666 READ DMA
c8 d8 01 00 00 00 e0 00 00:02:43.666 READ DMA
c8 d8 08 af 78 5e e0 00 00:02:39.780 READ DMA
c8 d8 01 00 00 00 e0 00 00:02:39.779 READ DMA
c8 d8 08 b7 78 5e e0 00 00:02:39.753 READ DMA
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Conveyance offline Completed without error 00%
1 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
[root@]# cat /etc/smartd.conf
# *SMARTD*AUTOGENERATED* /etc/smartd.conf
# Remove the line above if you have edited the file and you do not want
# it to be overwritten on the next smartd startup.
# Sample configuration file for smartd. See man 5 smartd.conf.
# Home page is:
http://smartmontools.sourceforge.net
# The file gives a list of devices to monitor using smartd, with one
# device per line. Text after a hash (#) is ignored, and you may use
# spaces and tabs for white space. You may use '\' to continue lines.
# You can usually identify which hard disks are on your system by
# looking in /proc/ide and in /proc/scsi.
# The word DEVICESCAN will cause any remaining lines in this
# configuration file to be ignored: it tells smartd to scan for all
# ATA and SCSI devices. DEVICESCAN may be followed by any of the
# Directives listed below, which will be applied to all devices that
# are found. Most users should comment out DEVICESCAN and explicitly
# list the devices that they wish to monitor.
# DEVICESCAN
# First (primary) ATA/IDE hard disk. Monitor all attributes
# /dev/hda -a
# Monitor SMART status, ATA Error Log, Self-test log, and track
# changes in all attributes except for attribute 194
# /dev/hdb -H -l error -l selftest -t -I 194
# A very silent check. Only report SMART health status if it fails
# But send an email in this case
/dev/hda -H -m root
# First two SCSI disks. This will monitor everything that smartd can
# monitor.
# /dev/sda -d scsi
# /dev/sdb -d scsi
# HERE IS A LIST OF DIRECTIVES FOR THIS CONFIGURATION FILE
# -d TYPE Set the device type to one of: ata, scsi
# -T TYPE set the tolerance to one of: normal, permissive
# -o VAL Enable/disable automatic offline tests (on/off)
# -S VAL Enable/disable attribute autosave (on/off)
# -H Monitor SMART Health Status, report if failed
# -l TYPE Monitor SMART log. Type is one of: error, selftest
# -f Monitor for failure of any 'Usage' Attributes
# -m ADD Send warning email to ADD for -H, -l error, -l selftest, and -f
# -M TYPE Modify email warning behavior (see man page)
# -p Report changes in 'Prefailure' Normalized Attributes
# -u Report changes in 'Usage' Normalized Attributes
# -t Equivalent to -p and -u Directives
# -r ID Also report Raw values of Attribute ID with -p, -u or -t
# -R ID Track changes in Attribute ID Raw value with -p, -u or -t
# -i ID Ignore Attribute ID for -f Directive
# -I ID Ignore Attribute ID for -p, -u or -t Directive
# -v N,ST Modifies labeling of Attribute N (see man page)
# -a Default: equivalent to -H -f -t -l error -l selftest
# -F TYPE Use firmware bug workaround. Type is one of: none, samsung
# -P TYPE Drive-specific presets: use, ignore, show, showall
# # Comment: text after a hash sign is ignored
# \ Line continuation character
# Attribute ID is a decimal integer 1 <= ID <= 255
# All but -d, -m and -M Directives are only implemented for ATA devices
#
# If the test string DEVICESCAN is the first uncommented text
# then smartd will scan for devices /dev/hd[a-l] and /dev/sd[a-z]
# DEVICESCAN may be followed by any desired Directives.